The unique advantages of the elliptical analyzer for precise and absolute spectral measurements are noted and detailed descriptions of its geometrical and physical optics are presented. The general characteristics are compared for the plane, convex, and concave fixed crystal analyzers which may be applied to the spectrometry of concentrated, intense plasma sources of x radiation involved, for example, in fusion energy and x-ray laser research. For this system, the enhancement in sensitivity and dynamic range over direct exposure x-ray film is 175 and 43 respectively. An absolute calibration of the 700 eV-8 keV detector system performed at 1.6 keV, has been shown to agree with a calculation of sensitivity based on photo-absorption data. At 182 A, the sensitivity and dynamic range are enhanced with respect to that for a standard photographic detector, by factors of 8 and 300 respectively.
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